发明名称 |
Method and apparatus for testing electronic components |
摘要 |
An apparatus and a method for testing one or more processors. The apparatus and method provide a host computer that issues test case information. The test case information is translated from the architecture used by a host computer to the architecture required by the electronic components. The processors are then able to perform the test case.
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申请公布号 |
US6973607(B2) |
申请公布日期 |
2005.12.06 |
申请号 |
US20010998390 |
申请日期 |
2001.11.29 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
BAIER HEINZ;BERRY ROBERT FRANCIS;CRISCOLO MICHAEL;MARTIN-DE-NICOLAS PEDRO;SAUNDERS MICHAEL TIMOTHY;SHAH KANTI C. |
分类号 |
G06F11/267;(IPC1-7):G01R31/28 |
主分类号 |
G06F11/267 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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