发明名称 TEST APPARATUS OF AUTO PROBE AND METHOD OF TESTING USING THE SAME
摘要 A test apparatus having an auto probe and a test method using the same reduces difficulties in defect detection which are caused by a manual test by operators. The test apparatus includes an auto probe unit that contacts a panel of a display device. A test pattern is input to the panel. A vision unit installed above the panel collects a pattern displayed on the panel. A computer system analyzes and determines information about the collected pattern. Whereas the panel was previously tilted from a horizontal position and then examined by the operator manually, in the present test method a movable camera installed at an auto probe apparatus permits testing while the panel is in the horizontal position.
申请公布号 KR20050114132(A) 申请公布日期 2005.12.05
申请号 KR20040039352 申请日期 2004.05.31
申请人 LG.PHILIPS LCD CO., LTD. 发明人 CHUNG, HAN ROK;BYUN, SUNG NAM
分类号 G02F1/13;G01R31/02;G09G3/00;(IPC1-7):G02F1/13 主分类号 G02F1/13
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