发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To prevent occurrence of a short-circuit between bumps even if pitches between the bumps are made narrow in the manufacturing method of a semiconductor device where a projection electrode installed in the semiconductor chip is bonded to a pad arranged in a member to be mounted. SOLUTION: The manufacturing method of the semiconductor device has a process for bonding stud bumps 8B disposed in a daughter chip 2B to the pads 15 arranged in a mother chip 3B, and a process for electrically connecting a probe 25 to the pads 15 by stabbing the probe to the pad and conducting a test of the mother chip 3B is formed. When the stud bumps 8B are bonded to the pads 15, recesses 26 whose shapes are sequentially extended toward opening ends formed in the pads 15 and tapered small projections 27 formed at tip parts of the stud bumps 8B are engaged and are bonded by the probe 25. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2005333167(A) 申请公布日期 2005.12.02
申请号 JP20050240363 申请日期 2005.08.22
申请人 FUJITSU LTD 发明人 ANDO FUMIHIKO;TAKASHIMA AKIRA;NISHIMURA TAKAO;NOMOTO TAKASHI;KASHU MASANORI
分类号 H01L21/60;(IPC1-7):H01L21/60 主分类号 H01L21/60
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