| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit device which can reduce effectively the operational faultiness caused by its voltage drop. SOLUTION: An LSI 10 is so partitioned into a plurality of segments 20 as to set in each segment 20 each region 40 for each decoupling capacitor to be disposed therein. In each segment 20, operational currents fed to each segment 20 by each main or auxiliary power-supply trunk line 16, 18 flow from each power-supply feeding position toward the periphery of each segment 20. Each decoupling capacitor is so disposed in the periphery as to deal with the IR drops generated at the terminals of the currents caused by each operational power supply. COPYRIGHT: (C)2006,JPO&NCIPI
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