| 摘要 |
PROBLEM TO BE SOLVED: To acquire data with high analysis density for every defective category with large compaction of failure analysis time by classifying non-defective goods and defective goods in a same storage box. SOLUTION: An automatic test device is equipped with a tray 20 for mounting devices to be tested, the devices in the tray 20 are tested with a plurality of items, and after the tests the devices are restored to the tray 20. When the defects are generated in the automatic test equipment, the defective devices are classified in the tray 20 for every defective item. COPYRIGHT: (C)2006,JPO&NCIPI
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