发明名称 |
METHOD FOR MEASURING DENSITY OF THIN LAYER AND LOSS MASS MEASURING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To precisely measure the change of mass and the change of density caused by the loss of the constituent molecule or atom of an irradiation layer. SOLUTION: The thickness of the irradiation layer of a substance irradiated with radiation and the energy of a positive electron necessary for passing through the irradiation layer while the calculated thickness of the irradiation layer is substituted for z(Ep) of the formula:ρ=AE<SB>p</SB><SP>n</SP>/z(E<SB>p</SB>) and the calculated energy of the positive electron is substituted for E<SB>p</SB>of the formula to calculateρof the formula. The calculatedρof the formula is set to the density of the irradiation layer. COPYRIGHT: (C)2006,JPO&NCIPI
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申请公布号 |
JP2005331433(A) |
申请公布日期 |
2005.12.02 |
申请号 |
JP20040151317 |
申请日期 |
2004.05.21 |
申请人 |
INSTITUTE OF PHYSICAL & CHEMICAL RESEARCH |
发明人 |
SAITO FUMINAGA;NAGASHIMA YASUYUKI;HYODO TOSHIO;GOTO AKIRA;SETORIYAMA TASUKU;SUZUKI YOSHIAKI;IWAKI MASAYA |
分类号 |
G01N23/02;(IPC1-7):G01N23/02 |
主分类号 |
G01N23/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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