发明名称 METHOD FOR MEASURING DENSITY OF THIN LAYER AND LOSS MASS MEASURING METHOD
摘要 PROBLEM TO BE SOLVED: To precisely measure the change of mass and the change of density caused by the loss of the constituent molecule or atom of an irradiation layer. SOLUTION: The thickness of the irradiation layer of a substance irradiated with radiation and the energy of a positive electron necessary for passing through the irradiation layer while the calculated thickness of the irradiation layer is substituted for z(Ep) of the formula:ρ=AE<SB>p</SB><SP>n</SP>/z(E<SB>p</SB>) and the calculated energy of the positive electron is substituted for E<SB>p</SB>of the formula to calculateρof the formula. The calculatedρof the formula is set to the density of the irradiation layer. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2005331433(A) 申请公布日期 2005.12.02
申请号 JP20040151317 申请日期 2004.05.21
申请人 INSTITUTE OF PHYSICAL & CHEMICAL RESEARCH 发明人 SAITO FUMINAGA;NAGASHIMA YASUYUKI;HYODO TOSHIO;GOTO AKIRA;SETORIYAMA TASUKU;SUZUKI YOSHIAKI;IWAKI MASAYA
分类号 G01N23/02;(IPC1-7):G01N23/02 主分类号 G01N23/02
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