METHOD AND STRUCTURE TO DEVELOP A TEST PROGRAM FOR SEMICONDUCTOR INTEGRATED CIRCUITS

摘要

A method for managing a pattern object file in a modular test system is disclosed. The method includes providing a modular test system, where the modular test system comprises a system controller for controlling at least one site controller, and where the at least one site controller controls at least one test module and its corresponding device under test (DUT). The method further includes creating an object file management framework for establishing a standard interface between vendor-supplied pattern compilers and the modular test system, receiving a pattern source file, creating a pattern object metafile based on the pattern source file using the object file management framework, and testing the device under test through the test module using the pattern object metafile.