发明名称 |
Method for identifying semiconductor integrated circuit device, method for manufacturing semiconductor integrated circuit device, semiconductor integrated circuit device and semiconductor chip |
摘要 |
In the manufacturing process of a semiconductor integrated circuit device, a plurality of identification elements having the same arrangement are formed and the relation of magnitude in a physical amount corresponding to variations in the process of the plurality of identification elements is employed as identification information unique to the semiconductor integrated circuit device.
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申请公布号 |
US2005263605(A1) |
申请公布日期 |
2005.12.01 |
申请号 |
US20050194487 |
申请日期 |
2005.08.02 |
申请人 |
HITACHI ULSI SYSTEMS CO., LTD. |
发明人 |
MURANAKA MASAYA |
分类号 |
G06K19/06;H01L21/66;H01L23/544;(IPC1-7):G06K19/06 |
主分类号 |
G06K19/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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