发明名称 |
NOVEL STRUCTURES OF SILICON CARBIDE METAL SEMICONDUCTOR FIELD EFFECT TRANSISTORS FOR HIGH VOLTAGE AND HIGH POWER APPLICATIONS |
摘要 |
<p>A silicon carbide metal semiconductor field effect transistor (MESFET) that includes a double-channel layer, with the lower channel being higher doped than the upper channel and a recessed gate. The higher doped lower channel layer is used to increase the channel current while the lower doped upper channel layer is used to improve the gate-drain breakdown voltage. A part of the gate nearer to the source is buried so as to allow a wider channel opening outside the buried gate region, and consequently reduce the source and drain resistances. The unburied gate nearer to the drain functions as a field plate and decreases the electric field crowding at the corner of the buried gate nearer to the drain and hence improves the gate-drain breakdown voltage. Overall a higher operating voltage and higher output power density for the MESFET is attainable.</p> |
申请公布号 |
WO2005114746(A1) |
申请公布日期 |
2005.12.01 |
申请号 |
WO2005SG00152 |
申请日期 |
2005.05.18 |
申请人 |
NANYANG TECHNOLOGICAL UNIVERSITY;RUSLI;ZHU, CHUNLIN |
发明人 |
RUSLI;ZHU, CHUNLIN |
分类号 |
H01L21/04;H01L29/24;H01L29/812;(IPC1-7):H01L29/812 |
主分类号 |
H01L21/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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