发明名称 |
Multiple sweep point testing of circuit devices |
摘要 |
An efficient method and apparatus for characterizing circuit devices is disclosed. In one embodiment, multiple test patterns for testing a circuit device are stored in a tester. Each test pattern includes both test data and control data that defines at least in part a sweep point at which the circuit device is tested. Thus, the tester can generate stimulus vectors for multiple sweep points without requiring control system intervention. Pass/fail indicators, each of which represents pass/fail results associated with a sweep point, are derived from the test results and stored in a Fail Capture Memory. A pass/fail boundary of the DUT can be determined from the contents of the Fail Capture Memory.
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申请公布号 |
US2005268196(A1) |
申请公布日期 |
2005.12.01 |
申请号 |
US20050201609 |
申请日期 |
2005.08.10 |
申请人 |
CHANG TIMOTHY C;STARK DONALD C |
发明人 |
CHANG TIMOTHY C.;STARK DONALD C. |
分类号 |
G01R31/319;G01R31/3193;(IPC1-7):G01R31/28;G06F11/00 |
主分类号 |
G01R31/319 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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