发明名称 |
Semiconductor integrated circuit device having scan flip-flop circuit |
摘要 |
Asemiconductor integrated circuit devices has a normal operation mode and a scan test operation mode, and includes a pulse generating circuit and a scan flip-flop circuit. The pulse generating circuit generates pulse signals synchronized with a clock signal in each of the normal and scan test operation modes. The scan flip-flop circuit latches data in response to the pulse signals from the pulse generating circuit signal in each of the normal and scan test operation modes.
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申请公布号 |
US2005268191(A1) |
申请公布日期 |
2005.12.01 |
申请号 |
US20050122382 |
申请日期 |
2005.05.05 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
SHIN YOUNG-MIN |
分类号 |
G01R31/26;G01R31/28;G01R31/3185;H03K19/00;(IPC1-7):G01R31/28 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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