| 摘要 |
A semiconductor integrated circuit apparatus includes an overheat protection circuit including a voltage generating circuit, a voltage comparing circuit, and a voltage outputting circuit. The voltage generating circuit generates two reference voltages having substantially equivalent responsiveness to an input voltage and different variation gradients with respect to a temperature change such that the different variation gradients intersect with each other at a predetermined temperature. The voltage comparing circuit compares the two reference voltages generated by the voltage generating circuit. The voltage outputting circuit outputs an output voltage when the different variation gradients do not intersect and changes the output voltage to an inverse output voltage upon intersection of the different variation gradients to stop an operation of circuits included in the semiconductor integrated circuit apparatus. An overheat protection method is also described.
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