发明名称 Semiconductor device, electro-optic device, integrated circuit, and electronic apparatus
摘要 The present invention is directed to a semiconductor device with a thin film transistor on a substrate and a method of forming that semiconductor device and thin film transistor on a substrate. The thin film transistor on the substrate is created by forming a starting point section to be an origin of crystallization of a semiconductor film on the substrate. The semiconductor film is then formed on the substrate originally provided with the starting point. Heat treatment is executed on the semiconductor film to form a substantially single crystal grain having a substantially centered starting point. The semiconductor film is patterned to form a transistor region and a thin film transistor is formed with by forming a gate insulation layer and the gate electrode on the transistor region. The thickness of the semiconductor film of the thin film transistor is less than or equal to 1/7 of the channel length.
申请公布号 US2005266620(A1) 申请公布日期 2005.12.01
申请号 US20050136389 申请日期 2005.05.25
申请人 SEIKO EPSON CORPORATION 发明人 HIROSHIMA YASUSHI
分类号 H01L21/20;H01L21/00;H01L21/336;H01L21/77;H01L21/84;H01L27/12;H01L29/76;H01L29/786;H01L29/94;H01L31/062;H01L31/113;H01L31/119;(IPC1-7):H01L21/00 主分类号 H01L21/20
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