发明名称 |
Semiconductor device, electro-optic device, integrated circuit, and electronic apparatus |
摘要 |
The present invention is directed to a semiconductor device with a thin film transistor on a substrate and a method of forming that semiconductor device and thin film transistor on a substrate. The thin film transistor on the substrate is created by forming a starting point section to be an origin of crystallization of a semiconductor film on the substrate. The semiconductor film is then formed on the substrate originally provided with the starting point. Heat treatment is executed on the semiconductor film to form a substantially single crystal grain having a substantially centered starting point. The semiconductor film is patterned to form a transistor region and a thin film transistor is formed with by forming a gate insulation layer and the gate electrode on the transistor region. The thickness of the semiconductor film of the thin film transistor is less than or equal to 1/7 of the channel length.
|
申请公布号 |
US2005266620(A1) |
申请公布日期 |
2005.12.01 |
申请号 |
US20050136389 |
申请日期 |
2005.05.25 |
申请人 |
SEIKO EPSON CORPORATION |
发明人 |
HIROSHIMA YASUSHI |
分类号 |
H01L21/20;H01L21/00;H01L21/336;H01L21/77;H01L21/84;H01L27/12;H01L29/76;H01L29/786;H01L29/94;H01L31/062;H01L31/113;H01L31/119;(IPC1-7):H01L21/00 |
主分类号 |
H01L21/20 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|