发明名称 TUNEABLE SEMICONDUCTOR DEVICE
摘要 <p>Disclosed is a method of forming a semiconductor structure that includes a discontinuous non-planar sub-collector having a different polarity than the underlying substrate. In addition, this structure includes an active area (collector) above the sub-collector, a base above the active area, and an emitter above the base. The distance between the discontinuous portions of the discontinuous sub-collector tunes the performance characteristics of the semiconductor structure. The performance characteristics that are tunable include breakdown voltage, unity current gain cutoff frequency, unity power gain cutoff frequency, transit frequency, current density, capacitance range, noise injection, minority carrier injection and trigger and holding voltage.</p>
申请公布号 WO2005114738(A1) 申请公布日期 2005.12.01
申请号 WO2004US12321 申请日期 2004.04.22
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION;FREEMAN, GREGORY, G.;RIEH, JAE-SUNG;SHERIDAN, DAVID, C.;ST.ONGE, STEPHEN, A.;STRICKER, ANDREAS, D.;VOLDMAN, STEVEN, H. 发明人 FREEMAN, GREGORY, G.;RIEH, JAE-SUNG;SHERIDAN, DAVID, C.;ST.ONGE, STEPHEN, A.;STRICKER, ANDREAS, D.;VOLDMAN, STEVEN, H.
分类号 H01L21/331;H01L21/332;H01L29/00;H01L29/08;H01L29/737;H01L29/74;H01L29/861;H01L29/872;H01L29/93;(IPC1-7):H01L29/00 主分类号 H01L21/331
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