| 摘要 |
a plurality of test modules (150) connected one of a plurality of sample devices (100) and supplying a test signal to the sample device (100) connected; a plurality of control devices (130) for controlling the plurality of test modules (150) and testing the plurality of sample devices (100) in parallel; and a connection setting device (140) for setting a connection format between the plurality of control devices (130) and the plurality of test modules (150) so that the plurality of control devices (130) are respectively connected to the plurality of sample devices (100).
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