发明名称 Method and device for determining microstructural parameters of thin porous layers
摘要 Gas is passed through a thin porous layer on a non-permeable support, and the flow is measured. During measurement, the gas is forced to travel along the thin layer; it enters and leaves on the same side. This side is opposite to the carrier side. The locations of gas entry and exit are separated by a seal, which lies against the porous layer. The apparatus is in two halves, the first includes the support and porous layer, the second includes the seal. These parts are brought together, forming inlet- and outlet gas chambers. The parts are held together to make the measurement. An independent claim is included for an apparatus for use in the above process.
申请公布号 EP1600760(A2) 申请公布日期 2005.11.30
申请号 EP20050007352 申请日期 2005.04.05
申请人 FORSCHUNGSZENTRUM JUELICH GMBH 发明人 WEDERSHOVEN, CHRISTIAN;VINKE, IZAAK C.;ROMMERSKIRCHEN, RICHARD;DE HAART, LAMBERTUS G.J.;GUBNER, ANDREAS
分类号 G01N15/08;H01M8/02 主分类号 G01N15/08
代理机构 代理人
主权项
地址