| 摘要 |
<P>PROBLEM TO BE SOLVED: To separately set a multibit test mode standardized by LEDEC, to set concurrently a special test mode not standardized by LEDEC and the multibit test mode to satisfy a specification, and to shorten a test time for a special test out of the specification. <P>SOLUTION: This semiconductor device is provided with a state detecting circuit 1610 for receiving control signals /RAS, /CAS, /WE, address signals A<SB>0</SB>, A<SB>1</SB>, and raw address signals /RA<SB>0</SB>, /RA<SB>1</SB>, to output timing detection signals /TDA, TDB, TDC and test group detection signals /TGA, /TGB, and a test mode setting signal generating circuit 1620 for receiving the raw address signals /RA<SB>0</SB>, /RA<SB>1</SB>, the timing detection signals /TDA, TDB, TDC and the test group detection signals /TGA, /TGB, to output a multibit test mode setting signal TE and test mode setting signals TEST1, TEST2, TEST3, TEST4, TEST5, TEST6, TEST7, corresponding thereto. <P>COPYRIGHT: (C)2006,JPO&NCIPI |
