发明名称 SEMICONDUCTOR ELEMENT INCLUDING TRENCH ELEMENT SEPARATION FILM AND MANUFACTURING METHOD FOR SUCH SEMICONDUCTOR ELEMENT
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor element including a trench element separation film that prevents charge trap and endures the application of a high gate voltage, and to provide a manufacturing method for the semiconductor element. SOLUTION: The semiconductor element comprises at least one or more layers of insulating films which are formed on the inner surface of a trench and include CVD oxide films containing nitrogen, and a nitride film liner formed on a charge trap preventive insulating film. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2005328049(A) 申请公布日期 2005.11.24
申请号 JP20050136433 申请日期 2005.05.09
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 KANG SUNG-TAEG;HAN JEONG-UK;PARK SUNG WOO
分类号 H01L21/76;B81C1/00;H01L21/762;H01L21/8234;(IPC1-7):H01L21/76 主分类号 H01L21/76
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