发明名称 |
SEMICONDUCTOR ELEMENT INCLUDING TRENCH ELEMENT SEPARATION FILM AND MANUFACTURING METHOD FOR SUCH SEMICONDUCTOR ELEMENT |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor element including a trench element separation film that prevents charge trap and endures the application of a high gate voltage, and to provide a manufacturing method for the semiconductor element. SOLUTION: The semiconductor element comprises at least one or more layers of insulating films which are formed on the inner surface of a trench and include CVD oxide films containing nitrogen, and a nitride film liner formed on a charge trap preventive insulating film. COPYRIGHT: (C)2006,JPO&NCIPI
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申请公布号 |
JP2005328049(A) |
申请公布日期 |
2005.11.24 |
申请号 |
JP20050136433 |
申请日期 |
2005.05.09 |
申请人 |
SAMSUNG ELECTRONICS CO LTD |
发明人 |
KANG SUNG-TAEG;HAN JEONG-UK;PARK SUNG WOO |
分类号 |
H01L21/76;B81C1/00;H01L21/762;H01L21/8234;(IPC1-7):H01L21/76 |
主分类号 |
H01L21/76 |
代理机构 |
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主权项 |
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地址 |
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