| 摘要 |
PROBLEM TO BE SOLVED: To provide an imaging apparatus capable of carrying out defect correction respectively properly for a reading method wherein an electric charge storage time of each pixel is the same and a reading method wherein an electric charge storage time by each pixel group is different from each other. SOLUTION: A signal detection circuit 211 and a controller 212 receive a signal from an imaging element and determine a pixel with a signal level in excess of a prescribed defect discrimination level to be a defective pixel. The defective pixel is determined respectively by a plurality of the reading method and addresses of the defective pixels are stored by each reading method. Thereafter, a defect correction circuit 208 reads the stored addresses of the defective pixels according to the reading method at photographing and applies prescribed correction processing to the defective pixels. Further, the controller 212 stores signal levels of the defective pixels, and carries out conversion of the signal level in response to each reading method so that detection of a defect by one reading method permits defect correction by a plurality of the reading methods as its control. COPYRIGHT: (C)2006,JPO&NCIPI
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