发明名称 SYSTEM, METHOD, AND MATERIAL PRODUCTION FOR DETERMINING FREQUENCY VALUES ASSOCIATED WITH FORCE APPLIED TO INSTRUMENTS
摘要 PROBLEM TO BE SOLVED: To provide a method for determining frequency values associated with force applied to an instrument. SOLUTION: This method contains a step (64) of calculating a plurality of 1st spectrum amplitudes, associated with 1st forced waveform applied to the instrument; a step (84) for calculating a plurality of 2nd spectrum amplitudes, associated with 2nd forced waveform applied to the instrument; steps (78, 98) of calculating the maximum spectrum amplitude, based on these plural 1st and 2nd spectrum amplitudes; a step (102) of determining amplitude threshold based on the maximum spectrum amplitude and the acceptable values; a step (104) of determining a plurality of 1st target frequency values, by selecting the frequency values associated with the subset of the 1st plural spectral amplitudes equal to or greater than the amplitude threshold; and a step (106) for determining a plurality of 2nd target frequency values by selecting frequency values, associated with the subset of the 2nd plural spectrum amplitudes equal to or greater than the amplitude threshold. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2005326399(A) 申请公布日期 2005.11.24
申请号 JP20050056751 申请日期 2005.03.02
申请人 GENERAL ELECTRIC CO <GE> 发明人 HATCH CHARLES T
分类号 G01H3/08;G01L23/00;G01M7/02;G01M15/00;G01R23/00;G05B15/02;G05B19/05;G05D16/20;G06F17/00;G10L25/90;(IPC1-7):G01H3/08 主分类号 G01H3/08
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