发明名称 SEMICONDUCTOR DEVICE AND SEMICONDUCTOR MANUFACTURING DEVICE THEREFOR
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor device capable of preventing the generation of short-circuit of the wire of a bonding wire made to flow by the pouring pressure of sealing material, such as resin or the like in a manufacturing process, after wire bonding or a sealing process. <P>SOLUTION: Insulating particles 7 are atomized and adhered to the bonding wires 3, respectively connecting bonding pads, selected from a plurality of bonding pads for a semiconductor chip 1 to a lead 2, and the particles 7 are cured thereafter to constitute the bonding wire 3 so that the surface thereof is coated by the adhered insulating particles 7. According to this constitution, the bonding wire 3 can be fixed so as to be unlikely to flow, by the pouring pressure of the sealing material 4 in the sealing process of the sealing material 4 which is the manufacturing process after wire bonding; and even if the bonding wire 3 is made to flow, short-circuiting of the wire can be prevented, whereby a semiconductor device of superior quality can be provided. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2005327824(A) 申请公布日期 2005.11.24
申请号 JP20040142973 申请日期 2004.05.13
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 INUI TADAHISA
分类号 H01L21/60 主分类号 H01L21/60
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