High-speed interface circuit test module, module under high-speed interface circuit test, and high-speed interface circuit test method

摘要

In the shipment test of an LSI provided with a high-speed interface circuit, both cost reduction and a high test guarantee level are realized. The following are provided: a high-speed interface circuit that is mounted on a load board interfacing with an LSI tester, is provided with a circuit converting the signal speed, and is capable of changing the transmission and reception characteristics; a controller that controls the transmission and reception characteristics of the high-speed interface circuit; a clock generator that generates the clock supplied to the high-speed interface circuit; a first connector provided specifically for the high-speed interface, connected to the high-speed interface circuit and provided with a signal port for performing high-speed signal communication with a circuit under test; and a second connector connected to the high-speed interface circuit and the LSI tester and provided with a signal port and a power port for performing low-speed signal communication with the high-speed interface circuit.