发明名称 BIMETAL LAYER MANUFACTURING METHOD
摘要 A bimetal layer manufacturing method includes the procedure of: forming a first dielectric layer on the surface of a semiconductor substrate which has a first metal layer (conductive layer) of a selected pattern formed thereon; forming a SOG layer on the surface of the first dielectric layer; forming a second dielectric layer; forming required via holes on the foregoing layers until reaching the first metal layer; forming a linear layer from a dielectrics material through PECVD; removing unnecessary linear layer from selected locations through an anisotropic plasma etching process; finally forming a second metal layer on a selected surface of the linear layer where MIM capacitors to be formed, and forming connection plugs in the via openings without generating via hole poison.
申请公布号 US2005260852(A1) 申请公布日期 2005.11.24
申请号 US20040851177 申请日期 2004.05.24
申请人 IP HIU F;MA ELLICK;YU YAN L;REN CHONG;SUN JI-WEI 发明人 IP HIU F.;MA ELLICK;YU YAN L.;REN CHONG;SUN JI-WEI
分类号 H01L21/02;H01L29/76;(IPC1-7):H01L29/76 主分类号 H01L21/02
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