| 摘要 |
A method for characterizing circuit activity in an IC. Generally, the method comprises the steps of activating an IC, resolving the switching activity in space and time, and generating a representation of the switching behavior which differentiates the time that circuits or transistors switch. One embodiment of the invention, utilizes a method such as, but not limited to, time resolved photon emission to observe transistor level switching activity in an integrated circuit (IC).
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