| 摘要 |
A lifecycle analyzer includes a temperature control element for controlling the temperature of a plurality of magnetoresistive (MR) elements, which may be, e.g., in bar, slider, head gimbal assembly, or head stack assembly form. The MR elements are in electrical contact with a stress probe element for applying a bias voltage or current stress. The MR elements and/or a magnetic field generator are moved to place one or more MR elements within the magnetic field of the magnetic field generator for testing. During testing, the MR elements are in electrical contact with a test probe element. The temperature of the MR elements may be controlled during both the stressing and testing.
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