| 摘要 |
PROBLEM TO BE SOLVED: To secure a needed detection rate, and to obtain the minimum test data, by considering the situation of diversified wiring, a part outer shape, or the like in a substrate test by a traveling prober. SOLUTION: Substrate test data are created from connection information, part information, resist information, and the like extracted from the design data of a substrate. Working hours for creating test data are reduced and the amount of test data is reduced without deteriorating test quality especially by a means for selecting a surrogate probe point including a through hole for an unprobable point, a means for selecting only the shortest point in measurement candidates in a short-circuiting fault test, a means for automatically calculating the expectation value of part characteristics from the connection information of analog parts, and the like. COPYRIGHT: (C)2006,JPO&NCIPI
|
