发明名称 Nonvolatile memory cells having high control gate coupling ratios using grooved floating gates and methods of forming same
摘要 A non-volatile memory cell includes a semiconductor substrate having a fin-shaped active region extending therefrom. A tunnel dielectric layer is provided, which extends on opposing sidewalls and an upper surface of the fin-shaped active region. A floating gate electrode is provided on the tunnel dielectric layer. This floating gate electrode has at least a partial groove therein. An inter-gate dielectric layer is also provided. This inter-gate dielectric layer extends on the floating gate electrode and into the at least a partial groove. A control gate electrode is provided, which extends on the inter-gate dielectric layer and into the at least a partial groove.
申请公布号 US2005260814(A1) 申请公布日期 2005.11.24
申请号 US20050121887 申请日期 2005.05.04
申请人 CHO EUN-SUK;LEE CHOONG-HO;KIM TAE-YONG 发明人 CHO EUN-SUK;LEE CHOONG-HO;KIM TAE-YONG
分类号 H01L21/28;H01L21/3205;H01L21/336;H01L29/423;H01L29/786;H01L29/788;(IPC1-7):H01L21/336;H01L21/320 主分类号 H01L21/28
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