Time delay evaluation

摘要

The invention concerns a method to evaluate whether a statistical time delay (TD) between a first event and a second event of a device under test is better than a test limit (TL). The method comprises the steps: performing a minimum number N of tests and evaluating the time delay (TD) from each test; modelling a first probability distribution (P1) of the evaluated time delays (TD) as a function of the elapsed time from the first occurrence of the first event to the first occurrence of the second event; obtaining a second probability distribution (P2) of the evaluated time delays (TD) as a function of the elapsed time from the first occurrence of the first event to the N-th occurrence of the second event by performing the N-1-th self convolution of the first probability distribution (P1); performing a statistical transformation in order to obtain a third probability distribution (P3) of the evaluated time delays (TD) as a function of the N-th occurence of the second event; deciding to pass the device under test, if a certain percentage of the area of the third probability distribution (P3) is on a good side (GS) of the test limit (TL2), or deciding to fail the device under test, if a certain percentage of the area of the third probability (P3) distribution is on a bad side (BS) of the test limit (TL2), otherwise repeating the steps of the method with an incremented number N of tests.