| 摘要 |
<p>An aid device is set to an inspection system for obtaining waveform data from an inspection object, calculating a value of a characteristic quantity that characterizes the inspection object and making a judgment whether the inspection object is normal or abnormal. The aid device selects one or more characteristic quantities and one or more parameters, calculates a value by using specified combinations of the selected characteristic quantities and parameters to obtain calculation results, and displays a graph based on each of the calculation results for the specified combinations. The graph has at least two axes, each representing a characteristic quantity set or a parameter set and makes a display by varying density, color, height or size corresponding to the results of the calculation. <IMAGE></p> |
