发明名称 Distributed diode fault check
摘要 A method and apparatus for testing for latent faults in the isolation devices of a system including redundant power supplies which supply power to one or more system units. A system controller is operable to perform a test cycle to perform the fault checks, which may including checks for short circuits and/or open circuits. The checks may be performed within a test cycle in which each of the isolation devices in the system is tested. The test cycle may be performed at regular intervals, the interval between each cycle being determinable by user input. In the event that a fault in one of the isolation devices is detected, the system controller may be operable to report the fault to an alarm system.
申请公布号 US6967487(B2) 申请公布日期 2005.11.22
申请号 US20030455753 申请日期 2003.06.04
申请人 SUN MICROSYSTEMS, INC. 发明人 GARNETT PAUL J.
分类号 G01R31/30;G01R31/40;G06F1/28;G06F11/20;H02J1/10;(IPC1-7):H01H31/02;G08B29/00 主分类号 G01R31/30
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