发明名称 SEMICONDUCTOR DEVICE COMPRISING FINFET AND FABRICATING METHOD THEREOF
摘要 <p>In one aspect, a semiconductor substrate is provided having a cell area and a peripheral circuit area, and a mask layer is formed over the cell area and the peripheral circuit area of the semiconductor substrate. A FinFET gate is fabricated by forming a first opening in the mask layer to expose a first gate region in the cell area of the semiconductor substrate, and then forming a FinFET gate electrode in the first opening using a damascene process. A MOSFET gate fabricated by forming a second opening in the mask layer to expose a second gate region in the peripheral circuit area of the semiconductor substrate, and then forming a MOSFET gate electrode in the second opening using a damascene process.</p>
申请公布号 KR20050110081(A) 申请公布日期 2005.11.22
申请号 KR20040034903 申请日期 2004.05.17
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KANG, HEE SOO;PARK, DONG GUN;LEE, CHOONG HO;CHO, HYE JIN;AHN, YOUNG JOON
分类号 H01L29/78;H01L21/00;H01L21/336;H01L21/822;H01L21/8244;H01L21/84;H01L27/06;H01L27/11;H01L27/12;H01L29/786;(IPC1-7):H01L29/78 主分类号 H01L29/78
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