发明名称 Temperature detecting circuit
摘要 A temperature detecting circuit includes a first delay unit for outputting a reference signal, a second delay unit for outputting a plurality of delay signals, a detecting unit for outputting a plurality of detecting signals according to the reference signal and delay signals, an encoder for encoding the plurality of the detecting signals, a buffer for outputting the output signal of the encoder to the outside and a fuse information from the outside to a select means, and the select unit that can be programmed according to the fuse information, for outputting a plurality of output signals to the detecting means according to a program state.
申请公布号 US6967521(B2) 申请公布日期 2005.11.22
申请号 US20030732430 申请日期 2003.12.10
申请人 HYNIX SEMICONDUCTOR INC. 发明人 LEE JUNG HWA
分类号 G01K3/10;(IPC1-7):H03K3/42 主分类号 G01K3/10
代理机构 代理人
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