发明名称 |
Method and apparatus for improved X-ray device image quality |
摘要 |
An X-ray device and method of improving the quality of an image formed by an X-ray device are provided. The X-ray device comprises a source emitting a beam of X-rays toward an object to be examined. A detector for receiving the X-rays that pass through the object is connected to an image processor. An X-ray collimator comprising a translatable element and at least one aperture for narrowing the beam of X-rays is arranged between the X-ray source and the examined object. A method of improving the quality of an image formed by the X-ray device comprises the steps of narrowing the X-ray beam using the aperture of the collimator, moving the aperture through the X-ray beam to expose the object to be examined to the narrowed X-ray beam, and forming an image of the examined object based upon the highest intensity value received for each pixel of the detector.
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申请公布号 |
US6968040(B2) |
申请公布日期 |
2005.11.22 |
申请号 |
US20020175987 |
申请日期 |
2002.06.20 |
申请人 |
KONINKLIJKE PHILIPS ELECTRONICS N.V. |
发明人 |
VAN WOEZIK JOHANNES THEODORUS MARIA |
分类号 |
G21K1/02;A61B6/00;A61B6/06;G01N23/04;H05G1/26;(IPC1-7):G21K1/02 |
主分类号 |
G21K1/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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