发明名称 Method and apparatus for improved X-ray device image quality
摘要 An X-ray device and method of improving the quality of an image formed by an X-ray device are provided. The X-ray device comprises a source emitting a beam of X-rays toward an object to be examined. A detector for receiving the X-rays that pass through the object is connected to an image processor. An X-ray collimator comprising a translatable element and at least one aperture for narrowing the beam of X-rays is arranged between the X-ray source and the examined object. A method of improving the quality of an image formed by the X-ray device comprises the steps of narrowing the X-ray beam using the aperture of the collimator, moving the aperture through the X-ray beam to expose the object to be examined to the narrowed X-ray beam, and forming an image of the examined object based upon the highest intensity value received for each pixel of the detector.
申请公布号 US6968040(B2) 申请公布日期 2005.11.22
申请号 US20020175987 申请日期 2002.06.20
申请人 KONINKLIJKE PHILIPS ELECTRONICS N.V. 发明人 VAN WOEZIK JOHANNES THEODORUS MARIA
分类号 G21K1/02;A61B6/00;A61B6/06;G01N23/04;H05G1/26;(IPC1-7):G21K1/02 主分类号 G21K1/02
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