发明名称 |
Device transfer mechanism for a test handler |
摘要 |
The invention provides a mechanism for a test handler using for electrical testing of electronic devices. The devices are placed on a platform configured to move semiconductor devices from an onloading position to an offloading position along a predetermined path. A transfer arm with a plurality of transfer heads connected to it is located adjacent the path. The transfer heads are configured to pick up and transfer semiconductor devices from the platform to a testing position for testing, and thereafter to transfer the semiconductor devices from the testing position to the platform for offloading.
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申请公布号 |
US6967475(B2) |
申请公布日期 |
2005.11.22 |
申请号 |
US20040763503 |
申请日期 |
2004.01.22 |
申请人 |
ASM ASSEMBLY AUTOMATION LTD. |
发明人 |
TSUI CHING MAN STANLEY;SZE CHAK TONG ALBERT;TSAI PEI WEI;CHOW LAP KEI ERIC |
分类号 |
G01R1/00;G01R31/26;G01R31/28;(IPC1-7):G01R31/26 |
主分类号 |
G01R1/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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