发明名称 |
Spring contact probe device for electrical testing |
摘要 |
The invention provides a unitary spring contact probe comprising a resilient spring section, a plunger section extending from a distal end of the resilient spring section for contacting a semiconductor device under test and a stopper projecting from the plunger section substantially transversely to an axial direction of the plunger section. There is also provided an apparatus for testing a semiconductor comprising a plurality of said unitary spring contact probes, one or more insulative guiding holders for mounting the spring contact probes, and a retainer mechanism coupled to the stoppers of the spring contact probes for securing the spring contact probes to the insulative guiding holders.
|
申请公布号 |
US6967492(B2) |
申请公布日期 |
2005.11.22 |
申请号 |
US20030722635 |
申请日期 |
2003.11.26 |
申请人 |
ASM ASSEMBLY AUTOMATION LTD. |
发明人 |
TSUI CHING MAN STANLEY;SZE CHAK TONG ALBERT;CHAN SHU KEI DENNIS;WONG SAI KIT JONATHAN |
分类号 |
G01R1/067;G01R1/073;(IPC1-7):G01R31/02 |
主分类号 |
G01R1/067 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|