摘要 |
In accordance with an aspect of the present invention, a wireless substrate-like sensor (112, 118) is configured to ensure it does not contaminate a semiconductor processing chamber. The sensor (112, 118) is sealed except for one or more apertures (272, 282). In one embodiment, a vent is disposed proximate the apertures. In another aspect, the aperture is coupled to a pressure equalization member (284) that deforms in response to a differential in pressure between the sensor interior and exterior. |
申请人 |
CYBEROPTICS SEMICONDUCTOR, INC.;RAMSEY, CRAIG, C.;GARDNER, DELRAE, H.;LASSAHN, JEFFREY, K. |
发明人 |
RAMSEY, CRAIG, C.;GARDNER, DELRAE, H.;LASSAHN, JEFFREY, K. |