| 摘要 |
PROBLEM TO BE SOLVED: To set tests of a plurality of kinds of IC's by a simple operation, and to perform the tests automatically, concerning an automatic test method and a program of the IC. SOLUTION: This method is constituted as follows: in order to test continuously the plurality of kinds of IC's, a schedule list wherein a plurality of test codes comprising a plurality of ID's for showing respectively the characteristic and a test condition of each IC are set and a definition table of the ID for showing the meaning of each ID of the test code are inputted into a test control device; the test code having the first number in the schedule list is taken out by the instruction of test start; the condition of the test program corresponding to the test code is set; the IC is moved from a tray part and set on a socket part connected to a test control device, and the test is performed; when the test by the first test code is finished, a test code having the next number in the schedule list is taken out; the condition of the corresponding test program is set, and the object IC is tested; and all the tests are performed successively. COPYRIGHT: (C)2006,JPO&NCIPI
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