发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method for manufacturing a semiconductor device to give no stress to a semiconductor chip, because, when an external electrode is connected to the electrode of the semiconductor chip after resin packaging, a packaging resin is adhered to the upper surface of the electrode of the semiconductor chip, and even after the packaging resin is removed from the upper surface thereof by cutting, the semiconductor chip may be damaged by stress generated at that time. SOLUTION: A surface-side protection insulated layer 5 is made of a photosensitive resin, and therefore, an opening hole 5a is formed on the upper portion of a surface electrode 2 by photolithography. As a result, the semiconductor chip 1a is hardly given any physical stress. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2005322774(A) 申请公布日期 2005.11.17
申请号 JP20040139592 申请日期 2004.05.10
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 TAKESHITA MITSUHIRO
分类号 H01L23/12;H01L21/56;(IPC1-7):H01L21/56 主分类号 H01L23/12
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