| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a method for inspecting a color filter for a liquid crystal display device, with which errors in detecting shape defects are reduced without sacrificing inspection efficiency in detecting the translucent patterned shape defects such as photo-spacers, alignment control protrusions and so on formed on the color filter by using a visual inspection device for the color filter. <P>SOLUTION: Quality of a shape of a fluorescent emission type resin structure is determined by making the fluorescent emission type resin structure 13 formed on the color filter for the liquid crystal display device is irradiated with an ultraviolet ray or an X-ray 14, so as to generate fluorescence, perform imaging and image processing of the fluorescence. <P>COPYRIGHT: (C)2006,JPO&NCIPI |
