| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit capable of self-diagnosing the open failure of a power source and a GND. SOLUTION: The semiconductor integrated circuit 20 comprises a plurality of pads 25; an internal wiring 40 connected to the plurality of pads 25; a monitor circuit 30 connected to the plurality of pads 25; and a detection circuit 60 connected to the monitor circuit 30. The monitor circuit 30 outputs a plurality of measurement signals SV corresponding to each potential of the plurality of pads 25 to the detection circuit 60. The detection circuit 60 detects a difference of potential in the plurality of pads 25 based on inputted plurality of measurement signals SV. COPYRIGHT: (C)2006,JPO&NCIPI
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