发明名称 Semiconductor device including isolation trench and method for fabricating the same
摘要 Provided is a trench isolation for a semiconductor device. The device includes an insulating layer formed on the inner surface of a trench and includes at least an N-containing CVD oxide layer, and a nitride liner formed on the insulating layer.
申请公布号 US2005255669(A1) 申请公布日期 2005.11.17
申请号 US20050095569 申请日期 2005.04.01
申请人 KANG SUNG-TAEG;HAN JEONG-UK;PARK SUNG-WOO 发明人 KANG SUNG-TAEG;HAN JEONG-UK;PARK SUNG-WOO
分类号 H01L21/76;B81C1/00;H01L21/762;H01L21/8234;(IPC1-7):H01L21/76 主分类号 H01L21/76
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