发明名称 STRUCTURE AND METHOD FOR FORMING A TRENCH MOSFET HAVING SELF-ALIGNED FEATURES
摘要 In accordance with an embodiment of the present invention, a semiconductor device is formed as follows. An exposed surface area of a silicon layer where silicon can be removed is defined. A portion of the silicon layer is removed to form a middle section of a trench extending into the silicon layer from the exposed surface area of the silicon layer. Additional exposed surface areas of the silicon layer where silicon can be removed are defined. Additional portions of the silicon layer are removed to form outer sections of the trench such that the outer sections of the trench extend into the silicon layer from the additional exposed surface areas of the silicon layer. The middle section of the trench extends deeper into the silicon layer than the outer sections of the trench.
申请公布号 WO2004105090(A3) 申请公布日期 2005.11.17
申请号 WO2004US15059 申请日期 2004.05.14
申请人 FAIRCHILD SEMICONDUCTOR CORPORATION;HERRICK, ROBERT;LOSEE, BECKY;PROBST, DEAN 发明人 HERRICK, ROBERT;LOSEE, BECKY;PROBST, DEAN
分类号 H01L21/336;H01L29/417;H01L29/78 主分类号 H01L21/336
代理机构 代理人
主权项
地址