发明名称 SUBSTRATE INSPECTION CONTACT, SUBSTRATE INSPECTION FIXTURE AND SUBSTRATE INSPECTION DEVICE USING THE CONTACT
摘要 PROBLEM TO BE SOLVED: To make two terminals abut to minute check points easily. SOLUTION: A contact 44 is composed of: a pin 441 of elastic rod (in this case, cylindrical shape) of electrical conductive material(for example, tungsten, beryllium copper etc.); a plunger 442 of electrical conductive material (for example, stainless steel etc.) arranged on both the ends of the pin 441 concentrically at the outer sides of the periphery of the pin 441, slidable in the axial direction along the circumferential plane of the pin 441; and a spiral spring 443 of electrically conductive material (for example, piano wire SWP-A etc.) supporting variably their positions in the axial direction of the pin 441. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2005321211(A) 申请公布日期 2005.11.17
申请号 JP20040137197 申请日期 2004.05.06
申请人 NIDEC-READ CORP 发明人 KATO MINORU
分类号 G01R1/067;G01R31/02;G01R31/28;(IPC1-7):G01R1/067 主分类号 G01R1/067
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