发明名称 System and method for testing integrated circuits
摘要 A module ( 236, 236 ') containing an integrated testing system ( 108 ) that includes one or more measurement engines ( 200, 202 ) tightly coupled with a compute engine ( 208 ). The one or more measurement engines include at least one stimulus instrument ( 212 ) for exciting circuitry of a device-under-test ( 104 ) with one or more stimulus signals, and at least one measurement instrument ( 216 ) that measures the response of the device-under-test to the stimulus signal(s) and generates measurement data. The compute engine includes computation logic circuitry ( 800 ) for determining whether or not the circuitry aboard the device-under-test passes or fails. The integrated testing system further includes a communications engine ( 204 ) providing two-way communications between the integrated testing system automated testing equipment ( 116 ) and/or a dedicated user interface ( 140 ) residing on a host computer ( 136 ).
申请公布号 US2005253617(A1) 申请公布日期 2005.11.17
申请号 US20040838846 申请日期 2004.05.03
申请人 DFT MICROSYSTEMS CANADA, INC. 发明人 ROBERTS GORDON W.;CHAN ANTONIO H.;DUERDEN GEOFFREY D.;HAFED MOHAMED M.;LABERGE SEBASTIEN;PISHDAD BARDIA;TAM CLARENCE K.
分类号 G01R31/26;G01R31/319;(IPC1-7):G01R31/26 主分类号 G01R31/26
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