| 摘要 |
A testing apparatus ( 2 ) includes a probe station ( 21 ), a micropositioner ( 22 ), a probe ( 23 ), an electronic camera ( 27 ), and a monitor. The probe station has a working surface ( 211 ) for supporting an object to be tested. The micropositioner is located on the working surface. The probe is mounted on the micropositioner, and is used for testing circuits of the object. The electronic camera is mounted on the micropositioner, and is used for taking images of the probe and the circuits. The monitor connects with the electronic camera, and is used for displaying the images. Because the testing apparatus utilizes the electronic camera to take images of the probes and the circuits, and the images are displayed on the monitor, a user can conveniently observe the testing process. Further, the electronic cameras help reduce the overall cost of the testing apparatus.
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