发明名称 Solid state detector
摘要 Disclosed is a solid state detector which comprises a photo-conductive layer for generating charges upon irradiation of recording light and a substrate laminated to the photo-conductive layer, the substrate having a thermal expansion coefficient different from that of the photo-conductive layer. The solid state detector prevents deformation and breakdowns due to temperature changes of environments. Specifically, the solid state detector comprises a photo-conductive layer and a substrate laminated to the photo-conductive layer, the substrate having a thermal expansion coefficient smaller than that of the photo-conductive layer. In the solid state detector a deformation suppression layer, which has a thermal expansion coefficient smaller than that of the photo-conductive layer and suppresses deformation resulting from thermal expansion of the photo-conductive layer and the substrate, is laminated on a side of the photo-conductive layer opposite from the side of the substrate.
申请公布号 US2005253097(A1) 申请公布日期 2005.11.17
申请号 US20050187002 申请日期 2005.07.22
申请人 FUJI PHOTO FILM CO., LTD. 发明人 AGANO TOSHITAKA
分类号 G01T1/24;G01N23/04;G01T1/00;H01L27/14;H01L27/146;H01L27/30;H01L31/02;H01L31/0232;H01L31/08;H04N5/32;(IPC1-7):G01N23/04 主分类号 G01T1/24
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