TEST PATTERN FOR NAND FLASH MEMORY DEVICE,申请号KR20040033202-传众专利搜索

首页产品黄页商标征信

会员服务注册登录

法人/股东/高管

发明名称	TEST PATTERN FOR NAND FLASH MEMORY DEVICE
摘要
申请公布号	KR20050108138(A)	申请公布日期	2005.11.16
申请号	KR20040033202	申请日期	2004.05.11
申请人	HYNIX SEMICONDUCTOR INC.	发明人	JOO, SEOK JIN
分类号	G11C29/00;(IPC1-7):G11C29/00	主分类号	G11C29/00
代理机构		代理人
主权项
地址

您可能感兴趣的专利

Piston assembly and connecting rod having a profiled wrist pin bore therefor

Starter for two-cycle engines

Multifunctional recreational vehicle

Bicycle handlebar with palm support

Bicycle shift control device

Air bubble detector

Aircraft air-conditioning system for the individual air conditioning of regions of an aircraft cabin with a liquid coolant

System and method for monitoring overheat of a compressor

Ice maker, refrigerator having the same, and ice making method thereof

Hydraulic control circuit for construction machine

Method for emptying pharmaceutical container

Electronic control for door/window

Barrel mounting and retention mechanism

Advertising display

Brake mechanism for a device for drying foods and other items

Leveling device and leveling method

Adaptive security policy based scalable video service apparatus and method

Managing resources using resource expiration data

Checkpoint based progressive backup

Method and apparatus for generating a summary of an audio/visual data stream