INTEGRATED CIRCUIT TESTING METHODS USING WELL BIAS MODIFICATION,申请号EP20030713598-传众专利搜索

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发明名称	INTEGRATED CIRCUIT TESTING METHODS USING WELL BIAS MODIFICATION
摘要
申请公布号	EP1595154(A1)	申请公布日期	2005.11.16
申请号	EP20030713598	申请日期	2003.02.20
申请人	INTERNATIONAL BUSINESS MACHINES CORPORATION	发明人	GATTIKER, ANNE;GROSCH, DAVID, A.;KNOX, MARC, D.;MOTIKA, FRANCO;NIGH, PHIL;VAN HORN, JODY;ZUCHOWSKI, PAUL, S.
分类号	G01R31/28;G01R31/30;(IPC1-7):G01R31/26	主分类号	G01R31/28
代理机构		代理人
主权项
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