METHOD OF CONTROLLING PHOTORESIST STRIPPING PROCESS AND REGENERATING PHOTORESIST STRIPPER COMPOSITION BASED ON NEAR INFRARED SPECTROMETER

摘要

In a method of controlling a photoresist stripping process for fabricating a semiconductor device or a liquid crystal display device, the composition of the stripper used in stripping the photoresist layer is first analyzed with the NIR spectrometer. The state of the stripper is then determined by comparing the analyzed composition with the reference composition. In case the life span of the stripper comes to an end, the stripper is replaced with a new stripper. By contrast, in case the life span of the stripper is left over, the stripper is delivered to the next photoresist stripping process. This analysis technique may be applied to the photoresist stripper regenerating process in a similar way.