摘要 |
In the semiconductor laser device of the present invention, a P-type diffusion region 3 A is disposed in an N<SUP>-</SUP> epitaxial layer 2 of a silicon submount 16 , and an N-type diffusion region 4 A is disposed in this P-type diffusion region 3 A. The P-type diffusion region 3 A and the N-type diffusion region 4 A are positioned under a red laser diode 14 , and the red laser diode 14 is directly connected on the N-type diffusion region 4 A via electrodes 7, 8 without an insulating film. Consequently, a short circuit between the red laser diode 14 and the silicon submount 16 can be prevented. Therefore, according to this semiconductor laser device, occurrence of deterioration or failure of a semiconductor light-emitting element upon a high-temperature operation can be prevented.
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